T. Metzger

Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

T. Metzger, R. Höpler, E. Born et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1998 · 553 citations

Natural Sciences, Materials Engineering, Materials Science +17

Thermal stability and desorption of Group III nitrides prepared by metal organic chemical vapor deposition

O. Ambacher, M. Brandt, R. Dimitrov et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 283 citations

Natural Sciences, Materials Engineering, Materials Science +17

Influence of substrate-induced biaxial compressive stress on the optical properties of thin GaN films

W. Rieger, T. Metzger, H. Angerer et al. · Applied Physics Letters · 1996 · 228 citations

Natural Sciences, Materials Engineering, Materials Science +17

Cation substitution models of congruent LiNbO3 investigated by X-ray and neutron powder diffraction

H. Boysen, F. Frey, T. Metzger et al. · Journal of Physics and Chemistry of Solids · 1994 · 145 citations

Natural Sciences, Materials Engineering, Materials Science +15

Raman study of the optical phonons in AlxGa1−xN alloys

A. Cros, H. Angerer, O. Ambacher et al. · Solid State Communications · 1997 · 65 citations

Natural Sciences, Materials Science, Physics +16