Journal of Applied Physics · 2002 · 30 citations · 18 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSpectroscopyElectron Beam LithographyEtching ProcessesNanostructured Electronic MaterialsQuantum DotsRaman SpectroscopySemiconductor NanomaterialsGallium Nitride (Gan) MaterialsNanoelectronic Device PhysicsNanofabrication Of Nanoelectronic DevicesRaman MicroscopyReactive Ion EtchingSpectroscopic Diagnostics
We present an optical investigation of GaN pillars using both micro-Raman (μ-Raman) and microphotoluminescence (μ-PL) spectroscopy. GaN pillars of diameter ranging from 100 nm to 5 μm were fabricated by electron beam lithography and reactive ion etching (RIE) with SiCl4 plasma. Optical measurements of both μ-Raman and μ-PL on individual pillars show consistent variations in the properties of the fabricated GaN structures as a function of GaN pillar size. μ-PL mapping gives strong evidence for defect-induced donors and/or acceptors near the facets of the RIE etched pillars. RIE for the nanostructuration of GaN could be used in the future to allow spectroscopic studies of a few or single quantum objects such as GaN quantum dots.
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GaN: Processing, defects, and devices
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