The nature of the dominant deep trap in amorphous silicon nitride films: Evidence for a negative correlation energy

Model for the Electronic Structure of Amorphous Semiconductors

P. W. Anderson · Physical Review Letters · 1975 · 1.5K citations

Natural Sciences, Materials Science, Physics +17

States in the Gap in Glassy Semiconductors

R. A. Street, N. F. Mott · Physical Review Letters · 1975 · 1K citations

Natural Sciences, Materials Science, Physics +17

Hole traps and trivalent silicon centers in metal/oxide/silicon devices

Patrick M. Lenahan, P. V. Dressendorfer · Journal of Applied Physics · 1984 · 716 citations

Engineering, Materials Engineering, Materials Science +17

Electron Spin Resonance in Amorphous Silicon, Germanium, and Silicon Carbide

M. H. Brodsky, R. S. Title · Physical Review Letters · 1969 · 443 citations

Natural Sciences, Materials Science, Physics +17

Electrically active point defects in amorphous silicon nitride: An illumination and charge injection study

D. T. Krick, Patrick M. Lenahan, Jerzy Kanicki · Journal of Applied Physics · 1988 · 177 citations

Engineering, Materials Engineering, Materials Science +17