Trap State Analysis

Trap State Analysis is a characterization method used in electronic material science that identifies and quantifies localized energy states within the bandgap of a semiconductor material, which trap charge carriers and thereby influence electrical and optoelectronic properties.

224

Publications

8.9K

Citations

918

Authors

338

Institutions

Publications per year

2017–2026

46

Authors

918

  1. BK
    B. Kaczer

    IMEC, Belgium

    4 publications · 118 citations

    4

    h-index

  2. GG
    G. Groeseneken

    IMEC, Belgium

    4 publications · 121 citations

    4

    h-index

  3. RP
    R. Pässler

    Chemnitz University of Technology, Germany

    3 publications · 45 citations

    3

    h-index

  4. AN
    Austin Nevin

    Politecnico di Milano, Italy

    3 publications · 94 citations

    3

    h-index

  5. DC
    Daniela Comelli

    Politecnico di Milano, Italy

    3 publications · 94 citations

    3

    h-index

1–5 of 918

Venues

  1. Applied Physics Letters

    20 publications · 1.1K citations

    17

    h-index

  2. Journal of Applied Physics

    21 publications · 655 citations

    14

    h-index

  3. Electronics Letters

    7 publications · 937 citations

    7

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 6 publications · 121 citations

    6

    h-index

  5. IEEE Transactions on Electron Devices

    6 publications · 622 citations

    6

    h-index

1–5