Trap State Analysis
Trap State Analysis is a characterization method used in electronic material science that identifies and quantifies localized energy states within the bandgap of a semiconductor material, which trap charge carriers and thereby influence electrical and optoelectronic properties.
224
Publications
8.9K
Citations
918
Authors
338
Institutions
Publications per year
2017–2026
46
224
Tomoki Doshida, Kenichi Takai · Acta Materialia · 2014 · 153 citations
Natural Sciences, Materials Engineering, Materials Science +17
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338

Centre National de la Recherche Scientifique
Paris, France
7 h-index
24 publications
757 citations
The University of Tokyo
Tokyo, Japan
6 h-index
10 publications
464 citations

Chinese Academy of Sciences
Beijing, China
6 h-index
16 publications
998 citations

Hong Kong University of Science and Technology
Hong Kong, Hong Kong
6 h-index
19 publications
1.2K citations
IMEC
Leuven, Belgium
5 h-index
36 publications
980 citations
Ruđer Bošković Institute
Zagreb, Croatia
5 h-index
11 publications
394 citations

University of Bologna
Bologna, Italy
5 h-index
16 publications
460 citations
Johannes Gutenberg University Mainz
Mainz, Germany
4 h-index
14 publications
396 citations
1–8 of 338
20 publications · 1.1K citations
17
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21 publications · 655 citations
14
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7 publications · 937 citations
7
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JJAP · 6 publications · 121 citations
6
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6 publications · 622 citations
6
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1–5