D. T. Krick

Electrically active point defects in amorphous silicon nitride: An illumination and charge injection study

D. T. Krick, Patrick M. Lenahan, Jerzy Kanicki · Journal of Applied Physics · 1988 · 177 citations

Optical Materials, Engineering, Optoelectronic Devices +20

Nature of the dominant deep trap in amorphous silicon nitride

D. T. Krick, Patrick M. Lenahan, Jerzy Kanicki · Physical review. B, Condensed matter · 1988 · 98 citations

Materials Science, Specific Point Defect, Negative Charge Injection +11

The nature of the dominant deep trap in amorphous silicon nitride films: Evidence for a negative correlation energy

Patrick M. Lenahan, D. T. Krick, Jerzy Kanicki · Applied Surface Science · 1989 · 68 citations

Materials Science, Negative Correlation Energy, Engineering +8

Stable photoinduced paramagnetic defects in hydrogenated amorphous silicon nitride

D. T. Krick, Patrick M. Lenahan, Jerzy Kanicki · Applied Physics Letters · 1987 · 63 citations

Semiconductors, Materials Science, Semiconductor Technology +15

Evidence for a negative electron-electron correlation energy in the dominant deep trapping center in silicon nitride films

Sean E. Curry, Patrick M. Lenahan, D. T. Krick et al. · Applied Physics Letters · 1990 · 54 citations

Electrical Engineering, Engineering, Physics +10