Solid-State Electronics · 1983 · 38 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsBipolar Junction TransistorsCurrent-voltage CharacteristicsDevice CharacterizationSemiconductor Device MaterialsSemiconductor SurfacesSurface PassivationPolysilicon
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Aluminum-silicon ohmic contact on “shallow” junctions
M. Finetti, P. Ostoja, S. Solmi et al. · Solid-State Electronics · 1980 · 44 citations