IEEE Transactions on Nuclear Science · 2013 · 20 citations · 17 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingMicroelectronicsNuclear PhysicsAlpha DecayDevice ReliabilityHardware Fault ToleranceRadioactive DecayNuclear Reaction DynamicsRadiation Effects On ReliabilityRadiation-hardened Memory DevicesRadiation-hardened MicroprocessorsRadiation-tolerant ElectronicsSoft Error ReliabilitySoft ErrorsUltra-low-voltage Circuit Design
This paper presents soft-error measurement results through neutron and alpha irradiation tests and simulation in SRAM at ultra-low voltages, down to 0.19 V. Soft-error-rate at 0.19 V is higher than at 1.0 V by two orders of magnitude. This measurement result supported by simulation clarifies that direct ionization from secondary protons generated by nuclear reaction with neutron collision contribute to a dramatic increase in SRAM soft-error-rate at ultra-low voltages in terrestrial environment.
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PHITS—a particle and heavy ion transport code system
Koji Niita, Tatsuhiko Sato, Hiroshi Iwase et al. · Radiation Measurements · 2006 · 396 citations