Solid-State Electronics · 1998 · 11 citations · 15 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice ModelingDevice ScalingDopingMetal-oxide-semiconductor Field-effect TransistorsSemiconductor Device MaterialsSemiconductor ReliabilityChannel Doping EffectsGate Oxide Thickness EffectsN-type DopingThreshold VoltageThreshold Voltage Modeling
15
Threshold voltage model for deep-submicrometer MOSFETs
zhenglin liu, Chenming Hu, Jiawei Huang et al. · IEEE Transactions on Electron Devices · 1993 · 480 citations
Engineering, Electrical Engineering, Electronic Materials +16