Publication | Closed Access
Carrier mobilities in silicon semi-empirically related to temperature, doping and injection level
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Citations
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References
1982
Year
Electrical EngineeringEngineeringInjection LevelPhysicsNanoelectronicsBias Temperature InstabilityApplied PhysicsSemiconductor Device FabricationElectronic PackagingSilicon On InsulatorMicroelectronicsCarrier MobilitiesSemiconductor Device
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