Mixed-Mode BIST Using Embedded Processors

Combinational profiles of sequential benchmark circuits

F. Brglez, D. Bryan, Krzysztof Koźmiński · 2003 · 2.1K citations

Engineering, Computer Engineering, Computer Science +17

Built-in test for VLSI: Pseudorandom techniques

Integration · 1989 · 866 citations

Engineering, Computer Engineering, Electrical Engineering +12

LFSR-coded test patterns for scan designs

B. Koenemann · Medical Entomology and Zoology · 1991 · 510 citations

Engineering, Computer Science, Design Automation +7

Built-in logic block observation techniques

B. Koenemann · Medical Entomology and Zoology · 1979 · 445 citations

Engineering, Computer Engineering, Computer Science +7

Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick et al. · IEEE Transactions on Computers · 1995 · 408 citations

Engineering, Computer Engineering, Computer Science +14