Test Generation is a software validation method that systematically produces test cases by deriving inputs and execution conditions from program specifications, models, or code structures to expose faults and ensure compliance with intended behavior.
4.9K
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238.2K
Citations
7.8K
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1.7K
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2017–2026
763
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Publications
4.9K
Combinational profiles of sequential benchmark circuits
F. Brglez, D. Bryan, Krzysztof Koźmiński · 2003 · 2.1K citations
Akers · IEEE Transactions on Computers · 1978 · 1.8K citations
Koushik Sen, Darko Marinov, Gul Agha · 2005 · 1.7K citations
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7.8K
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42
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37
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33
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33
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Institutions
1.7K
University of Illinois Urbana-Champaign
Urbana, United States
48 h-index
238 publications
19.1K citations
Microsoft (United States)
Redmond, United States
45 h-index
165 publications
16K citations
University of Sheffield
Sheffield, United Kingdom
45 h-index
127 publications
10.7K citations
The University of Texas at Austin
Austin, United States
39 h-index
198 publications
10.8K citations
AT&T (United States)
Bedminster, United States
37 h-index
139 publications
9.2K citations
North Carolina State University
Raleigh, United States
36 h-index
114 publications
6.1K citations
Simula Research Laboratory
Oslo, Norway
35 h-index
76 publications
6.2K citations
IBM (United States)
Armonk, United States
34 h-index
175 publications
15.1K citations
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Venues
- IEEE Transactions on Software Engineering
TSE · 112 publications · 18.8K citations
63
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- IEEE Transactions on Computers
115 publications · 11.1K citations
54
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- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
174 publications · 10.2K citations
50
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- Software Testing Verification and Reliability
STVR · 69 publications · 7K citations
34
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- Information and Software Technology
48 publications · 2.2K citations
28
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