Journal of Alloys and Compounds · 2015 · 14 citations · 36 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials ChemistryOptical MaterialsDielectric CeramicsDielectricsElectrical Properties Of CeramicsElectro-optic EffectsOptical Properties Of SolidsSemiconductor Device MaterialsBoron IncorporationElectrical PropertiesElectrical Properties AnalysisGate DielectricsGate Oxides
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Trap-assisted tunneling in high permittivity gate dielectric stacks
Michel Houssa, M. Tuominen, M. Naili et al. · Journal of Applied Physics · 2000 · 353 citations