Simultaneous Switching Noise
Simultaneous Switching Noise is a type of signal integrity degradation manifested as voltage fluctuation on power and ground networks, caused by the concurrent switching of multiple output drivers in integrated circuits, which distinguishes it from other noise sources by its direct dependence on the number and timing of simultaneously active switching events.
88
Publications
2.8K
Citations
236
Authors
81
Institutions
Publications per year
2017–2026
6
Variants
Delta-i Noise
88
1–5 of 88
236
Korea Advanced Institute of Science and Technology, South Korea
9 publications · 250 citations
9
h-index
8
h-index
8
h-index
4
h-index
Korea Advanced Institute of Science and Technology, South Korea
4 publications · 124 citations
4
h-index
1–5 of 236
81
Korea Advanced Institute of Science and Technology
Daejeon, South Korea
10 h-index
49 publications
1.6K citations
Georgia Institute of Technology
Atlanta, United States
8 h-index
27 publications
1K citations
University of Arizona
Tucson, United States
8 h-index
20 publications
1K citations
Missouri University of Science and Technology
Rolla, United States
6 h-index
16 publications
702 citations

University of Waterloo
Waterloo, Canada
3 h-index
4 publications
133 citations

Hanyang University
Seoul, South Korea
3 h-index
5 publications
115 citations
Institute of Microelectronics
Singapore, Singapore
3 h-index
6 publications
338 citations
Toshiba (Japan)
Tokyo, Japan
3 h-index
9 publications
188 citations
1–8 of 81
13 publications · 728 citations
13
h-index
10 publications · 366 citations
10
h-index
9 publications · 232 citations
9
h-index
5 publications · 113 citations
5
h-index
3 publications · 319 citations
3
h-index
1–5