C.C. Wei

Single-transistor latch in SOI MOSFETs

C.-D. Chen, M. Matloubian, R. Sundaresan et al. · IEEE Electron Device Letters · 1988 · 192 citations

Positive Feedback, Electrical Engineering, Engineering +10

Titanium disilicide contact resistivity and its impact on 1-µm CMOS circuit performance

D.B. Scott, R. A. Chapman, C.C. Wei et al. · IEEE Transactions on Electron Devices · 1987 · 78 citations

Hot-carrier induced electron mobility and series resistance degradation in LDD NMOSFET's

Yutao Pan, K.K. Ng, C.C. Wei · IEEE Electron Device Letters · 1994 · 48 citations

Engineering, Series Resistant Drift, Electron Mobility +16

0.5 micron CMOS for high performance at 3.3 V

R. A. Chapman, C.C. Wei, David A. Bell et al. · 2003 · 47 citations

Engineering, Vlsi Design, Computer Architecture +16

Titanium nitride local interconnect technology for VLSI

T.E. Tang, C.C. Wei, R.A. Haken et al. · IEEE Transactions on Electron Devices · 1987 · 44 citations

Engineering, Vlsi Design, Integrated Circuits +17