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An 0.8µm CMOS technology for high performance logic applications
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Citations
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References
1987
Year
Unknown Venue
Electrical EngineeringEngineeringVlsi DesignHigh-speed ElectronicsDevice IntegrationApplied PhysicsComputer ArchitectureCmos TechnologyComputer EngineeringPatterned LevelsCmos Logic TechnologyOptoelectronic DevicesIntegrated CircuitsProcess ArchitectureMicroelectronics
This paper reports on the process architecture and results of an 0.8µm 5V CMOS logic technology. The process, which is a factor of two faster than current 1.2µm CMOS technology, features seven optically patterned levels with 0.8µm geometries: isolation, gates, contacts, vias, TiN local interconnect (LI), and two metal levels.
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