James W. Miller

The effects of boron penetration on p/sup +/ polysilicon gated PMOS devices

J.R. Pfiester, F.K. Baker, T.C. Mele et al. · IEEE Transactions on Electron Devices · 1990 · 211 citations

Electrical Engineering, Polysilicon Gate, Engineering +13

Boosted and distributed rail clamp networks for ESD protection in advanced CMOS technologies

Michael Stockinger, James W. Miller, Michael G. Khazhinsky et al. · 2003 · 93 citations

Hardware Security, Electrical Engineering, Esd Protection +7

Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies

Cynthia A. Torres, James W. Miller, Michael Stockinger et al. · Microelectronics Reliability · 2002 · 56 citations

Electrical Engineering, Engineering, Vlsi Design +9

The rise of peri-urban aquaculture in Nigeria

James W. Miller, Tunde Atanda · International Journal of Agricultural Sustainability · 2011 · 42 citations

Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe

Michael Stockinger, James W. Miller · Electrical Overstress/Electrostatic Discharge Symposium · 2006 · 40 citations

Hbm Timeframe, Engineering, Vlsi Design +16