7
Publications
151
Citations
7
H-Index
1986
Active since
G. Shinn is an author at Texas Instruments (United States) specializing in engineering, materials science, and microelectronics.
Top concepts
EngineeringMaterial ScienceApplied PhysicsMicroelectronicsElectronic PackagingElectrical EngineeringMemory DevicesMicrostructureOptoelectronicsSurface Science
Publications per year
1986–2008
7
7
A study of within-wafer non-uniformity metrics
T. Smith, Duane S. Boning, S. Fang et al. · 2003 · 14 citations
Materials Science, Within-wafer Nonuniformity, Multiple Metrics +15
Rows per page
1–5 of 7