Scott R. Summerfelt - Concepedia

Author

Scott R. Summerfelt

Also Known As

Lauren E. Gleason, S. R. SUMMERFELT, S. R. Summerfelt, S. Summerfelt, S.R. Summerfelt, Scott R. Summerfelt, Scott Summerfelt, Scott. R. Summerfelt

107

Publications

2.8K

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)The University of Texas at Dallas Cornell University Agilent Technologies (United States)North Carolina State University

About

Scott R. Summerfelt is an author at Texas Instruments (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	38	2K
2	Applied Physics	20	33	1.8K
3	Chemistry	5	5	113
4	Chemical Engineering	2	2	78
5	Natural Sciences	1	1	26

Scott R. Summerfelt

Publications

2.2K

Citations

H-Index

Page 1

	Year	Citations
Large ferroelectric polarization of TiN/Hf0.5Zr0.5O2/TiN capacitors due to stress-induced crystallization at low thermal budget Si Joon Kim, Dushyant Narayan, Jae‐Gil Lee, Applied Physics Letters EngineeringLow Thermal BudgetStress-induced CrystallizationAtomic LayerFerroelectric Application	2017	286
High-Permittivity Perovskite Thin Films for Dynamic Random-Access Memories A. I. Kingon, S. K. Streiffer, C. Basceri, MRS Bulletin Dynamic Random-access MemoriesElectrical EngineeringEngineeringApplied PhysicsPerovskite Materials	1996	228
Ten-Nanometer Ferroelectric $\hbox{Si:HfO}_{2}$ Films for Next-Generation FRAM Capacitors Stefan Mueller, Scott R. Summerfelt, Johannes Müller, IEEE Electron Device Letters Materials ScienceMaterials EngineeringElectrical EngineeringEngineeringElectronic Materials	2012	161
Effect of film thickness on the ferroelectric and dielectric properties of low-temperature (400 °C) Hf0.5Zr0.5O2 films Si Joon Kim, Jaidah Mohan, Jaebeom Lee, Applied Physics Letters Materials ScienceDielectric PropertiesEngineeringFerroelectric ApplicationFilm Thickness	2018	155
A 64-Mb Embedded FRAM Utilizing a 130-nm 5LM Cu/FSG Logic Process H. McAdams, R. Acklin, T.G.W. Blake, IEEE Journal of Solid-State Circuits 64-Mb Embedded FramNon-volatile MemoryEngineeringVlsi DesignElectronic Design	2004	119
Reliability Properties of Low-Voltage Ferroelectric Capacitors and Memory Arrays J. Antonio Travieso-Rodríguez, K. Remack, K. Boku, IEEE Transactions on Device and Materials Reliability ReliabilityNon-volatile MemoryElectrical EngineeringEngineeringReliability Properties	2004	107
Observation of the early stages of growth of superconducting thin films by transmission electron microscopy M. Grant Norton, Lisa A. Tietz, Scott R. Summerfelt, Applied Physics Letters Superconducting MaterialEngineeringTransmission Electron MicroscopyCopper Oxide ParticlesUltrathin Films	1989	101
Surface preparation for the heteroepitactic growth of ceramic thin films M. Grant Norton, Scott R. Summerfelt, C. Barry Carter Applied Physics Letters Materials ScienceSurface PreparationEngineeringStep TerracesSurface Science	1990	92
Low-voltage operation and high endurance of 5-nm ferroelectric Hf0.5Zr0.5O2 capacitors Si Joon Kim, Jaidah Mohan, Harrison Sejoon Kim, Applied Physics Letters Materials ScienceMaterials EngineeringElectrical EngineeringMagnetic PropertiesEngineering	2018	79
An 8MHz 75&#x00B5;A/MHz zero-leakage non-volatile logic-based Cortex-M0 MCU SoC exhibiting 100% digital state retention at V<inf>DD</inf>=0V with &lt;400ns wakeup and sleep transitions Steven Bartling, Sudhanshu Khanna, Mike Clinton,	2013	71

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