C. Basceri - Concepedia

Concepedia

Author

C. Basceri

North Carolina State University

Also Known As

C Basceri, C. Basceri, Cem BASCERI, Cem Basceri

40

Publications

1.6K

Citations

15

H-Index

35

Concepts

All Affiliations

North Carolina State University RWTH Aachen University Cree (China)Argonne National Laboratory Texas Instruments (United States)

CB

About

C. Basceri is an author at North Carolina State University specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	16	1.5K
2	Applied Physics	14	16	1.5K
3	Electrical Engineering	7	7	691
4	Materials Engineering	7	7	543
5	Chemical Engineering	1	1	60

C. Basceri

×

18

Publications

1.6K

Citations

15

H-Index

	Year	Citations
The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition C. Basceri, S. K. Streiffer, Angus I. Kingon, Journal of Applied Physics Materials ScienceMultiferroicsNonlinear Dielectric ResponseEngineeringMaterial Analysis	1997	370
Leakage currents in Ba0.7Sr0.3TiO3 thin films for ultrahigh-density dynamic random access memories G. Dietz, M. Schumacher, Rainer Waser, Journal of Applied Physics Non-volatile MemoryEngineeringChemical DepositionBa0.7sr0.3tio3 Thin FilmsSuperconductivity	1997	339
Ferroelectricity in thin films: The dielectric response of fiber-textured (BaxSr1−x)Ti1+yO3+z thin films grown by chemical vapor deposition S. K. Streiffer, C. Basceri, Charles B. Parker, Journal of Applied Physics Materials ScienceMaterial AnalysisEngineeringCrystalline DefectsFerroelectric Application	1999	251
High-Permittivity Perovskite Thin Films for Dynamic Random-Access Memories A. I. Kingon, S. K. Streiffer, C. Basceri, MRS Bulletin Dynamic Random-access MemoriesElectrical EngineeringEngineeringApplied PhysicsPerovskite Materials	1996	228
Synthesis and characterization of high purity, single phase GaN powder Cengiz M. Balkaş, C. Basceri, R. F. Davis Powder Diffraction Materials ScienceMaterials EngineeringChemical EngineeringSingle-phase Gallium NitrideHigh Temperature Materials	1995	60
100 mm 4HN-SiC Wafers with Zero Micropipe Density R.T. Leonard, Yuri I. Khlebnikov, Adrian R. Powell, Materials science forum Materials EngineeringMaterials ScienceWafer Scale ProcessingZero Micropipe DensityEngineering	2008	54
Dielectric Behavior of CVD (Ba,Sr)TiO<sub>3</sub> thin Films on Pt/Si S. K. Streiffer, C. Basceri, A. I. Kingon, MRS Proceedings Materials ScienceEngineeringApplied PhysicsSemiconductor MaterialThin Film Process Technology	1995	36
Leakage mechanisms and dielectric properties of Al2O3/TiN-based metal-insulator-metal capacitors Shuang Meng, C. Basceri, B. Busch, Applied Physics Letters DielectricsEngineeringThin Film Process TechnologyCharge TransportLeakage Mechanisms	2003	34
Electrothermal evaluation of thick GaN epitaxial layers and AlGaN/GaN high-electron-mobility transistors on large-area engineered substrates Travis J. Anderson, Andrew D. Koehler, Marko J. Tadjer, Applied Physics Express SemiconductorsWide-bandgap SemiconductorElectrical EngineeringElectronic DevicesEngineering	2017	33
Resistance degradation behavior of Ba<sub>0.7</sub>Sr<sub>0.3</sub>TiO<sub>3</sub> thin films compared to mechanisms found in titanate ceramics and single crystals M. Grossmann, S. Gusowski, Rainer Waser, Integrated ferroelectrics Materials ScienceSingle CrystalsMaterial AnalysisTitanate CeramicsEngineering	1998	28

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