Statistics
Publications
1.1K
Citations
40.4K
Authors
53
Location
Shenzhen, China
1.1K
A New Degradation Mechanism in High-Voltage SiC Power MOSFETs
Anant Agarwal, Fatima Husna, Sarah K. Haney et al. · IEEE Electron Device Letters · 2007 · 293 citations
Orsolya Vincze, Fernando Colchero, Jean-François Lemaître et al. · Nature · 2021 · 240 citations · Full text
1–5 of 1.1K
53
34
h-index
28
h-index
21
h-index
19
h-index
17
h-index
1–5 of 53