H. McAdams

A 64-Mb Embedded FRAM Utilizing a 130-nm 5LM Cu/FSG Logic Process

H. McAdams, R. Acklin, T.G.W. Blake et al. · IEEE Journal of Solid-State Circuits · 2004 · 121 citations

Engineering, Computer Engineering, Electrical Engineering +14

Reliability Properties of Low-Voltage Ferroelectric Capacitors and Memory Arrays

J. Antonio Travieso-Rodríguez, K. Remack, K. Boku et al. · IEEE Transactions on Device and Materials Reliability · 2004 · 108 citations

Engineering, Electrical Engineering, Materials Science +17

An 8MHz 75µA/MHz zero-leakage non-volatile logic-based Cortex-M0 MCU SoC exhibiting 100% digital state retention at V<inf>DD</inf>=0V with <400ns wakeup and sleep transitions

Steven Bartling, Sudhanshu Khanna, Mike Clinton et al. · 2013 · 71 citations

Engineering, Computer Engineering, Embedded Systems +16

An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at <formula formulatype="inline"> <tex Notation="TeX">${\rm VDD}=$</tex></formula> 0 V Achieving Zero Leakage With <formula formulatype="inline"><tex Notation="TeX">${<}$</tex> </formula>400-ns Wakeup Time for ULP Applications

Sudhanshu Khanna, Steven Bartling, M.A. Clinton et al. · IEEE Journal of Solid-State Circuits · 2013 · 65 citations

Engineering, Computer Engineering, Computer Science +17

Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

W.R. McKee, H. McAdams, E.B. Smith et al. · 1996 · 56 citations

Engineering, Computer Engineering, Physics +13