E.B. Smith

Neutron-induced boron fission as a major source of soft errors in deep submicron SRAM devices

R. Baumann, E.B. Smith · 2002 · 87 citations

Engineering, Nuclear Engineering, Physics +13

Neutron-induced 10B fission as a major source of soft errors in high density SRAMs

R. Baumann, E.B. Smith · Microelectronics Reliability · 2001 · 73 citations

Engineering, Nuclear Engineering, Physics +10

Cosmic ray neutron induced upsets as a major contributor to the soft error rate of current and future generation DRAMs

W.R. McKee, H. McAdams, E.B. Smith et al. · 1996 · 56 citations

Engineering, Computer Engineering, Physics +13

Observation of discrete donor-acceptor pair spectra in MBE grown GaAs

D. C. Reynolds, K. K. Bajaj, C. W. Litton et al. · Solid State Communications · 1984 · 35 citations

Natural Sciences, Materials Science, Physics +9

Identification of residual donors in high-purity epitaxial GaAs with the use of magneto-optical spectroscopy

D. C. Reynolds, K. K. Bajaj, C. W. Litton et al. · Physical review. B, Condensed matter · 1983 · 30 citations

Natural Sciences, Materials Science, Electronic Materials +12