N.F. Haddad

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations

Engineering, Electrical Engineering, Physics +17

Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design

Brian D. Olson, Dennis R. Ball, Kevin M. Warren et al. · IEEE Transactions on Nuclear Science · 2005 · 155 citations

Engineering, Computer Engineering, Electrical Engineering +17

Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

Dale McMorrow, Joseph S. Melinger, S. Büchner et al. · IEEE Transactions on Nuclear Science · 2000 · 154 citations

Engineering, Computer Engineering, Electrical Engineering +15

Impact of Ion Energy and Species on Single Event Effects Analysis

Robert A. Reed, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2007 · 118 citations

Medicine, Nuclear Engineering, Physics +13

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

Jeffrey D. Black, Dennis R. Ball, William H. Robinson et al. · IEEE Transactions on Nuclear Science · 2008 · 83 citations

Engineering, Computer Engineering, Electrical Engineering +13