Kuo-Ming Wu

Hot-carrier reliability in submicrometer 40V LDMOS transistors with thick gate oxide

J.F. Chen, Kuo-Ming Wu, Kaung-Wan Lin et al. · 2005 · 33 citations

Electrical Engineering, Engineering, Hardware Reliability +11

Effect of Drift-Region Concentration on Hot-Carrier-Induced $R_{\rm on}$ Degradation in nLDMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2008 · 27 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +11

Dynamic Turn-On Mechanism of the n-MOSFET Under High-Current Stress

Dao-Hong Yang, Jone F. Chen, Jian‐Hsing Lee et al. · IEEE Electron Device Letters · 2008 · 22 citations

Dynamic Turn-on Mechanism, Electrical Engineering, Engineering +9

Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors

Jone F. Chen, Shiang-Yu Chen, Kuo-Ming Wu et al. · IEEE Transactions on Electron Devices · 2009 · 20 citations

Device Modeling, Electrical Engineering, Engineering +12

off-State Avalanche-Breakdown-Induced on-Resistance Degradation in Lateral DMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2007 · 20 citations

Device Modeling, Electrical Engineering, Engineering +11