J. R. Lee

Effect of Drift-Region Concentration on Hot-Carrier-Induced $R_{\rm on}$ Degradation in nLDMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2008 · 28 citations

Engineering, Electrical Engineering, Materials Science +15

off-State Avalanche-Breakdown-Induced on-Resistance Degradation in Lateral DMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2007 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Anomalous Reduction of Hot-Carrier-Induced On-Resistance Degradation in n-Type DEMOS Transistors

Kuo-Ming Wu, J.F. Chen, Yan Su et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 20 citations

Engineering, Electrical Engineering, Electronic Materials +16

Anomalous Hot-Carrier-Induced Increase in Saturation-Region Drain Current in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors

Shiang-Yu Chen, Jone F. Chen, J. R. Lee et al. · IEEE Transactions on Electron Devices · 2008 · 17 citations

Engineering, Electrical Engineering, Microelectronics +14

Gate current dependent hot-carrier-induced degradation in LDMOS transistors

J.F. Chen, Kuen-Shiuan Tian, S.-Y. Chen et al. · Electronics Letters · 2008 · 10 citations

Engineering, Electrical Engineering, Microelectronics +16