Jone F. Chen

On-Resistance Degradation Induced by Hot-Carrier Injection in LDMOS Transistors With STI in the Drift Region

Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen et al. · IEEE Electron Device Letters · 2008 · 83 citations

Semiconductor Technology, Electrical Engineering, Shallow-trench Isolation +14

Electromigration under time-varying current stress

Tao Jiang, B.K. Liew, Jone F. Chen et al. · Microelectronics Reliability · 1998 · 33 citations

Electrical Engineering, Electromigration Technique, Engineering +6

Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors

Jone F. Chen, Shiang-Yu Chen, Kuo-Ming Wu et al. · IEEE Transactions on Electron Devices · 2009 · 20 citations

Device Modeling, Electrical Engineering, Engineering +12

off-State Avalanche-Breakdown-Induced on-Resistance Degradation in Lateral DMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2007 · 20 citations

Device Modeling, Electrical Engineering, Engineering +11