Shiang-Yu Chen

On-Resistance Degradation Induced by Hot-Carrier Injection in LDMOS Transistors With STI in the Drift Region

Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen et al. · IEEE Electron Device Letters · 2008 · 83 citations

Semiconductor Technology, Electrical Engineering, Shallow-trench Isolation +14

An Investigation on Anomalous Hot-Carrier-Induced On-Resistance Reduction in n-Type LDMOS Transistors

J.F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 29 citations

Semiconductor Technology, Electrical Engineering, Engineering +9

Convergence of Hot-Carrier-Induced Saturation Region Drain Current and On-Resistance Degradation in Drain Extended MOS Transistors

Jone F. Chen, Shiang-Yu Chen, Kuo-Ming Wu et al. · IEEE Transactions on Electron Devices · 2009 · 20 citations

Device Modeling, Electrical Engineering, Engineering +12

Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors

Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen et al. · IEEE Transactions on Electron Devices · 2009 · 17 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +12

Anomalous Hot-Carrier-Induced Increase in Saturation-Region Drain Current in n-Type Lateral Diffused Metal–Oxide–Semiconductor Transistors

Shiang-Yu Chen, Jone F. Chen, J. R. Lee et al. · IEEE Transactions on Electron Devices · 2008 · 16 citations

Device Modeling, Metal–oxide–semiconductor Transistors, Electrical Engineering +12