T.N. Nguyen

High-field-induced degradation in ultra-thin SiO/sub 2/ films

P. Olivo, T.N. Nguyen, B. Riccò · IEEE Transactions on Electron Devices · 1988 · 298 citations

Materials Science, Electrical Engineering, Engineering +14

Nonequilibrium boron doping effects in low-temperature epitaxial silicon films

B.S. Meyerson, F. K. LeGoues, T.N. Nguyen et al. · Applied Physics Letters · 1987 · 172 citations

Materials Science, Materials Engineering, Boron Nitride +13

Low Temperature Silicon Epitaxy by Hot Wall Ultrahigh Vacuum/Low Pressure Chemical Vapor Deposition Techniques: Surface Optimization

B.S. Meyerson, E. Ganin, D. A. Smith et al. · Journal of The Electrochemical Society · 1986 · 103 citations · Full text

Engineering, Material Epitaxial, Integrated Circuits +16

A gate-quality dielectric system for SiGe metal-oxide-semiconductor devices

Subramanian S. Iyer, P. M. Solomon, V. P. Kesan et al. · IEEE Electron Device Letters · 1991 · 89 citations

Materials Engineering, High-quality Dielectric System, Electrical Engineering +13

The relation between positive charge and breakdown in metal-oxide-silicon structures

Z. A. Weinberg, T.N. Nguyen · Journal of Applied Physics · 1987 · 76 citations

Electrical Engineering, Semiconductor Device, Engineering +13