Z. A. Weinberg - Concepedia

Author

Z. A. Weinberg

IBM Research - Thomas J. Watson Research Center

Also Known As

Z A Weinberg, Z. A. Weinberg, Z. WEINBERG, Z.A. Weinberg, Zeev A. Weinberg

Publications

2.5K

Citations

H-Index

Concepts

All Affiliations

IBM Research - Thomas J. Watson Research Center Princeton University IBM (United States)

About

Z. A. Weinberg is an author at IBM Research - Thomas J. Watson Research Center specializing in applied physics, engineering, and physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Applied Physics	22	26	2.2K
2	Engineering	21	25	2K
3	Natural Sciences	2	2	88
4	Chemical Engineering	1	1	11
5	Chemistry	1	1	56

Z. A. Weinberg

Publications

2.2K

Citations

H-Index

Page 1

	Year	Citations
On tunneling in metal-oxide-silicon structures Z. A. Weinberg Journal of Applied Physics SemiconductorsMaterials ScienceOxide HeterostructuresSemiconductor TechnologyEngineering	1982	557
Tunneling of electrons from Si into thermally grown SiO2 Z. A. Weinberg Solid-State Electronics Tunneling MicroscopyPhysicsApplied PhysicsSiliceneSilicon On Insulator	1977	217
Location of positive charges in SiO2 films on Si generated by vuv photons, x rays, and high-field stressing D. J. DiMaria, Z. A. Weinberg, J. Aitken Journal of Applied Physics EngineeringVacuum DeviceSilicon On InsulatorSio2 FilmsVuv Photons	1977	168
High-field transport in SiO2 on silicon induced by corona charging of the unmetallized surface Z. A. Weinberg, W. C. Johnson, Murray A. Lampert Journal of Applied Physics EngineeringGlow DischargeSilicon On InsulatorCharge TransportSemiconductor Device	1976	150
The effect of gate metal and SiO2 thickness on the generation of donor states at the Si-SiO2 interface Massimo V. Fischetti, Z. A. Weinberg, J. A. Calise Journal of Applied Physics Materials ScienceSemiconductorsElectrical EngineeringSi–sio2 InterfaceEngineering	1985	115
SiO2-induced substrate current and its relation to positive charge in field-effect transistors Z. A. Weinberg, Massimo V. Fischetti, Y. Nissan‐Cohen Journal of Applied Physics Electrical EngineeringEngineeringField-effect TransistorsPhysicsPositive Charge	1986	90
Hole conduction and valence-band structure of Si3N4 films on Si Z. A. Weinberg, R. A. Pollak Applied Physics Letters Materials ScienceSemiconductorsSemiconductor TechnologyEngineeringPhysics	1975	83
Photon assisted tunneling from aluminum into silicon dioxide Z. A. Weinberg, A. Hartstein Solid State Communications PhotonicsEngineeringTunneling MicroscopyPhysicsApplied Physics	1976	81
The relation between positive charge and breakdown in metal-oxide-silicon structures Z. A. Weinberg, T.N. Nguyen Journal of Applied Physics Electrical EngineeringSemiconductor DeviceEngineeringPhysicsPositive Charge	1987	76
Investigation of the SiO2-induced substrate current in silicon field-effect transistors Z. A. Weinberg, Massimo V. Fischetti Journal of Applied Physics Electrical EngineeringEngineeringDevice ChannelPhysicsExperimental Investigation	1985	75

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