P. Kurpas

GaAs surface control during metalorganic vapor phase epitaxy by reflectance anisotropy spectroscopy

F. Reinhardt, W. Richter, A. B. Müller et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1993 · 67 citations

Natural Sciences, Materials Engineering, Materials Science +17

Correlation of InGaP(001) surface structure during growth and bulk ordering

M. Zorn, P. Kurpas, A. Shkrebtii et al. · Physical review. B, Condensed matter · 1999 · 64 citations

Natural Sciences, Materials Engineering, Materials Science +17

Real-time monitoring of MOVPE device growth by reflectance anisotropy spectroscopy and related optical techniques

J.‐T. Zettler, K. Haberland, M. Zorn et al. · Journal of Crystal Growth · 1998 · 57 citations

Natural Sciences, Materials Engineering, Materials Science +12

Reliability issues of GaN based high voltage power devices

Joachim Wuerfl, Eldad Bahat‐Treidel, Frank Brunner et al. · Microelectronics Reliability · 2011 · 57 citations

Engineering, Electrical Engineering, Materials Science +14

Spectroscopic process sensors in MOVPE device production

K. Haberland, P. Kurpas, Markus Pristovsek et al. · Applied Physics A · 1999 · 36 citations

Engineering, Materials Engineering, Materials Science +14