J. P. Campbell

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Publications

Citations

1.6K

H-Index

Active since

1969

Affiliations

National Institute of Standards and Technology(Current)

Pennsylvania State University

Theiss Research

University of Maryland, College Park

Texas Instruments (United States)

J. P. Campbell is an author at National Institute of Standards and Technology specializing in microelectronics, semiconductor devices, and electrical engineering.

ORCID

Publications per year

1969–2023

Publications

Atomic-scale defects involved in the negative-bias temperature instability

J. P. Campbell, Patrick M. Lenahan, Corey J. Cochrane et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 108 citations

Engineering, Electrical Engineering, Physics +17

Near Fields of Truncated-Gaussian Apertures*

J. P. Campbell, L. G. DeShazer · Journal of the Optical Society of America · 1969 · 90 citations

Natural Sciences, Physics, Computational Electromagnetics +15

Modeling Early Breakdown Failures of Gate Oxide in SiC Power MOSFETs

Z. Chbili, Asahiko Matsuda, Jaafar Chbili et al. · IEEE Transactions on Electron Devices · 2016 · 89 citations

Engineering, Electrical Engineering, Materials Science +17

Density of states of Pb1 Si/SiO2 interface trap centers

J. P. Campbell, Patrick M. Lenahan · Applied Physics Letters · 2002 · 87 citations

Natural Sciences, Materials Science, Physics +17

A Simple Series Resistance Extraction Methodology for Advanced CMOS Devices

J. P. Campbell, Kin P. Cheung, John S. Suehle et al. · IEEE Electron Device Letters · 2011 · 87 citations

Engineering, Electrical Engineering, Circuit Theory +10

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