Asahiko Matsuda

Modeling Early Breakdown Failures of Gate Oxide in SiC Power MOSFETs

Z. Chbili, Asahiko Matsuda, Jaafar Chbili et al. · IEEE Transactions on Electron Devices · 2016 · 89 citations

Engineering, Electrical Engineering, Materials Science +17

Optical and Electrical Characterization of Hydrogen-Plasma-Damaged Silicon Surface Structures and Its Impact on In-line Monitoring

Yoshinori Nakakubo, Asahiko Matsuda, Masanaga Fukasawa et al. · Japanese Journal of Applied Physics · 2010 · 59 citations

Engineering, Materials Engineering, Materials Science +17

Effects of Plasma-Induced Si Recess Structure on n-MOSFET Performance Degradation

Koji Eriguchi, Asahiko Matsuda, Yoshinori Nakakubo et al. · IEEE Electron Device Letters · 2009 · 53 citations

Engineering, Electrical Engineering, Physics +15

Modeling of ion-bombardment damage on Si surfaces for in-line analysis

Asahiko Matsuda, Yoshinori Nakakubo, Yoshinori Takao et al. · Thin Solid Films · 2009 · 52 citations

Engineering, Materials Engineering, Materials Science +16

Model for Bias Frequency Effects on Plasma-Damaged Layer Formation in Si Substrates

Koji Eriguchi, Yoshinori Nakakubo, Asahiko Matsuda et al. · Japanese Journal of Applied Physics · 2010 · 51 citations

Natural Sciences, Electrical Engineering, Physics +13