Jaafar Chbili

Statistics

Publications

Citations

147

H-Index

Active since

2015

Affiliations

George Mason University(Current)

National Institute of Standards and Technology

Sidi Mohamed Ben Abdellah University

Jaafar Chbili is an author at George Mason University specializing in gate oxide reliability, time-dependent dielectric breakdown, and oxide breakdown.

Publications per year

2015–2017

Publications

Modeling Early Breakdown Failures of Gate Oxide in SiC Power MOSFETs

Z. Chbili, Asahiko Matsuda, Jaafar Chbili et al. · IEEE Transactions on Electron Devices · 2016 · 89 citations

Engineering, Electrical Engineering, Materials Science +17

Time Dependent Dielectric Breakdown in High Quality SiC MOS Capacitors

Z. Chbili, Kin P. Cheung, J. P. Campbell et al. · Materials science forum · 2016 · 31 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Cloud Security Automation Framework

Cihan Tunc, Salim Hariri, Mheni Merzouki et al. · 2017 · 17 citations

Computing, Cloud Computing, Computer Science +14

Massively parallel TDDB testing: SiC power devices

Z. Chbili, Jaafar Chbili, J. P. Campbell et al. · 2015 · 10 citations

Engineering, Electrical Engineering, Electronic Materials +16

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