Corey J. Cochrane

Atomic-scale defects involved in the negative-bias temperature instability

J. P. Campbell, Patrick M. Lenahan, Corey J. Cochrane et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 107 citations

Engineering, Defect Tolerance, Semiconductor Device +17

An electrically detected magnetic resonance study of performance limiting defects in SiC metal oxide semiconductor field effect transistors

Corey J. Cochrane, Patrick M. Lenahan, Aivars J. Lelis · Journal of Applied Physics · 2011 · 91 citations

Semiconductors, Magnetism, Electrical Engineering +15

Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon carbide

Corey J. Cochrane, Jordana Blacksberg, Mark Anders et al. · Scientific Reports · 2016 · 90 citations · Full text

Science Overview of the Europa Clipper Mission

R. T. Pappalardo, B. J. Buratti, H. Korth et al. · Space Science Reviews · 2024 · 74 citations · Full text

Space Mission, Engineering, Satellite Instrumentation +12

Identification of a silicon vacancy as an important defect in 4H SiC metal oxide semiconducting field effect transistor using spin dependent recombination

Corey J. Cochrane, P. M. Lenahan, Aivars J. Lelis · Applied Physics Letters · 2012 · 67 citations

Spintronics, Electrical Engineering, Sdr Response +11