G. Groos

Optical patterning of GaN films

M. K. Kelly, O. Ambacher, B. Dahlheimer et al. · Applied Physics Letters · 1996 · 142 citations

Materials Science, Rapid Nitrogen Effusion, Electrical Engineering +14

Quantitative internal thermal energy mapping of semiconductor devices under short current stress using backside laser interferometry

D. Pogány, S. Bychikhin, C. Fürböck et al. · IEEE Transactions on Electron Devices · 2002 · 60 citations

Total Energy, Engineering, Short Current Stress +18

Measurement and modeling of the electron impact-ionization coefficient in silicon up to very high temperatures

Susanna Reggiani, N. Jensen, G. Groos et al. · IEEE Transactions on Electron Devices · 2005 · 46 citations

Engineering, Silicon On Insulator, Semiconductor Device +19

Single-shot thermal energy mapping of semiconductor devices with the nanosecond resolution using holographic interferometry

D. Pogány, V. Dubec, S. Bychikhin et al. · IEEE Electron Device Letters · 2002 · 34 citations

Nanosecond Resolution, Engineering, Holographic Method +22

Thermal and free carrier concentration mapping during ESD event in smart Power ESD protection devices using an improved laser interferometric technique

C. Fürböck, Kai Esmark, Martin Litzenberger et al. · Microelectronics Reliability · 2000 · 33 citations

Electrical Engineering, Engineering, Esd Event +2