V. Dubec

Moving Current Filaments in Integrated DMOS Transistors Under Short-Duration Current Stress

M. Denison, M. Blaho, Pavel Rodin et al. · IEEE Transactions on Electron Devices · 2004 · 42 citations

Device Modeling, Electrical Engineering, Engineering +13

Single-shot thermal energy mapping of semiconductor devices with the nanosecond resolution using holographic interferometry

D. Pogány, V. Dubec, S. Bychikhin et al. · IEEE Electron Device Letters · 2002 · 34 citations

Nanosecond Resolution, Engineering, Holographic Method +22

Moving Current Filaments in Integrated DMOS Transistors Under Short-Duration Current Stress

M. Denison, M. Blaho, Pavel Rodin et al. · IEEE Transactions on Electron Devices · 2004 · 27 citations

Device Modeling, Electrical Engineering, Engineering +13

Hot spot dynamics in quasivertical DMOS under ESD stress

M. Denison, M. Blaho, D. Silber et al. · 2004 · 20 citations

Engineering, Power Electronics, Quasivertical Dmos Transistors +16

Hot Spot Dynamics in Quasi Vertical DMOS under ESD Stress

Mane Denison, Matej Blaho, D. Silber et al. · 2003 · 15 citations

Device Modeling, Electrical Engineering, Engineering +12