D. Silber - Concepedia

Author

D. Silber

University of Bremen

Also Known As

D. SILBER, D. Silber, Dieter Silber

Publications

1.1K

Citations

H-Index

Concepts

All Affiliations

University of Bremen Infineon Technologies (Germany)Deutsches Institut für Telemedizin und Gesundheitsförderung Goethe University Frankfurt TU Wien

About

D. Silber is an author at University of Bremen specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	19	29	876
2	Applied Physics	15	20	657
3	Natural Sciences	4	4	127
4	Computer Engineering	4	4	117
5	Chemistry	3	3	98

D. Silber

Publications

916

Citations

H-Index

Page 1

	Year	Citations
Minority-carrier diffusion coefficients in highly doped silicon J. Dziewior, D. Silber Applied Physics Letters Optical MaterialsEngineeringSemiconductor MaterialsOptoelectronic DevicesSilicon On Insulator	1979	120
On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche Martin Domeij, Josef Lutz, D. Silber IEEE Transactions on Electron Devices Electrical EngineeringSi Power DiodesEngineeringDestruction LimitBias Temperature Instability	2003	74
Electron Spin Resonance of Tl<sup>++</sup> Centres in KCl Crystals Wolfgang Dreybrodt, D. Silber physica status solidi (b) EngineeringTheoretical Inorganic ChemistryMagnetic ResonanceEsr SignalsAbsorption Spectroscopy	1967	55
Limitation of the short-circuit ruggedness of high-voltage IGBTs A. Kopta, Munaf Rahimo, U. Schlapbach, IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs Electrical EngineeringEngineeringDestruction MechanismPower DeviceNanoelectronics	2009	49
Investigations on the stability of dynamic avalanche in IGBTs P. D. Rose, D. Silber, A. Porst, Electrical EngineeringEngineeringTransient ElectronicsHigh Current DensitiesBias Temperature Instability	2003	42
Moving Current Filaments in Integrated DMOS Transistors Under Short-Duration Current Stress M. Denison, M. Blaho, Pavel Rodin, IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringIntegrated Dmos TransistorsStress-induced Leakage Current	2004	42
Thermal effects on the forward characteristics of silicon p-i-n diodes at high pulse currents D. Silber, M. J. Robertson Solid-State Electronics Electrical EngineeringSemiconductor DeviceEngineeringHigh Pulse CurrentsBias Temperature Instability	1973	39
Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents B. Gutsmann, P. Mourick, D. Silber Electrical EngineeringPower ModuleEngineeringCircuit AnalysisPower Device	2002	35
Dielectric charge traps. A new structure element for power devices H. Kapels, R. Plikat, D. Silber DielectricsEngineeringDielectric Charge TrapsPower ElectronicsCharge Transport	2002	34
Radiation defect distribution in proton-irradiated silicon W. Wondrak, D. Silber Journal of Applied Physics Deep-level Transient SpectroscopyIon ImplantationEngineeringNuclear PhysicsCrystalline Defects	1987	29

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