Arthur Huber

Lock-In IR-Thermography – A Novel Tool for Material and Device Characterization

S. Huth, Otwin Breitenstein, Arthur Huber et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2001 · 83 citations

Can Si(113) wafers be an alternative to Si(001)?

H.‐J. Müssig, J. Da̧browski, K.‐E. Ehwald et al. · Microelectronic Engineering · 2001 · 19 citations

Materials Science, Materials Engineering, Wafer Scale Processing +6

Integrity of ultrathin gate oxides with different oxide thickness, substrate wafers and metallic contaminations

R. Hölzl, Arthur Huber, L. Fabry et al. · Applied Physics A · 2001 · 19 citations

Materials Science, Electrical Engineering, Ultrathin Gate Oxides +9

Revitalizing the Technical Excellence of the Workforce at the Arnold Engineering Development Center (AEDC)and Beyond

John Best, Edward Kraft, Arthur Huber · 2008 · 14 citations

Engineering, Education, Software Engineering +19

Vapor Phase Decomposition - Droplet Collection: Can we Improve the Collection Efficiency for Copper Contamination?

Stefan De Gendt, Arthur Huber, Bart Onsia et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1998 · 10 citations

Chemical Engineering, Engineering, Environmental Engineering +5