A. Naem

Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

W.K. Henson, Ni Yang, Stefan Kubicek et al. · IEEE Transactions on Electron Devices · 2000 · 115 citations

Engineering, Computer Engineering, Electrical Engineering +17

Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliability

R. Degraeve, N. Pangon, B. Kaczer et al. · 1999 · 56 citations

Engineering, Electrical Engineering, Materials Science +17

Platinum silicide formation using rapid thermal processing

A. Naem · Journal of Applied Physics · 1988 · 51 citations

Engineering, Materials Engineering, Materials Science +17

Thickness dependence of the properties and thermal stability of PtSi films

S. R. Das, K. Sheergar, Dan‐Xia Xu et al. · Thin Solid Films · 1994 · 38 citations

Natural Sciences, Materials Engineering, Materials Science +16

Influence of gate length on ESD-performance for deep sub micron CMOS technology

Karlheinz Bock, B. Keppens, V. De Heyn et al. · 2003 · 37 citations

Engineering, Electrical Engineering, Low-power Design +12