S. R. Das

Material aspects of nickel silicide for ULSI applications

Dan‐Xia Xu, S. R. Das, C. J. Peters et al. · Thin Solid Films · 1998 · 73 citations

Materials Engineering, Materials Science, Engineering +4

Thickness dependence of the properties and thermal stability of PtSi films

S. R. Das, K. Sheergar, Dan‐Xia Xu et al. · Thin Solid Films · 1994 · 37 citations

Materials Science, Materials Engineering, Ptsi Films +11

Process Windows of Nickel and Platinum Silicides in Deep Sub-Micron Regime

Dan‐Xia Xu, S. R. Das, J. P. McCaffrey et al. · MRS Proceedings · 1995 · 28 citations

Materials Science, Nanoscale Science, Process Windows +11

Structural and electronic property evolution of nickel and nickel silicide thin films on Si(100) from multicore x-ray-absorption fine-structure studies

S. J. Naftel, I. Coulthard, T. K. Sham et al. · Physical review. B, Condensed matter · 1998 · 12 citations

Magnetic Properties, X-ray Spectroscopy, Engineering +16

Thermal Stability of Nickel Silicide Films

S. R. Das, Dan‐Xia Xu, M. Nournia et al. · MRS Proceedings · 1996 · 10 citations

Materials Science, Materials Engineering, Engineering +7