Ni Yang

Modeling study of ultrathin gate oxides using direct tunneling current and capacitance-voltage measurements in MOS devices

Ni Yang, W.K. Henson, John R. Hauser et al. · IEEE Transactions on Electron Devices · 1999 · 230 citations

Device Modeling, Electrical Engineering, Mos Devices +13

Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

W.K. Henson, Ni Yang, Stefan Kubicek et al. · IEEE Transactions on Electron Devices · 2000 · 115 citations

Engineering, Vlsi Design, Off-state Leakage Currents +16

A comparative study of gate direct tunneling and drain leakage currents in n-MOSFET's with sub-2 nm gate oxides

Ni Yang, W.K. Henson, J. J. Wortman · IEEE Transactions on Electron Devices · 2000 · 106 citations

Device Modeling, Gate Direct Tunneling, Electrical Engineering +12

Effects of transition metals on the evolution of polymer-derived SiOC ceramics

Ni Yang, Kathy Lu · Carbon · 2020 · 70 citations · Full text

Materials Science, Silicate Ceramics, Engineering +7

Single-phased and color tunable LiSrBO 3 :Dy 3+ , Tm 3+ , Eu 3+ phosphors for white-light-emitting application

Gemei Cai, Ni Yang, Hangzhao Liu et al. · Journal of Luminescence · 2017 · 57 citations

White Oled, Photonics, Solid-state Lighting +10