J. Hildreth

Optical constants and ellipsometric thickness determination of strained Si1−xGex:C layers on Si (100) and related heterostructures

Stefan Zollner, J. Hildreth, Ran Liu et al. · Journal of Applied Physics · 2000 · 26 citations

Strained Si1−xgex, Optical Materials, Engineering +18

Embedded SiGe S/D PMOS on thin body SOI substrate with drive current enhancement

D. Zhang, Bich-Yen Nguyen, T. White et al. · 2005 · 24 citations

Electrical Engineering, Sige S/d Pmos, Engineering +12

Strained SiGe Channels for Band-Edge PMOS Threshold Voltages With Metal Gates and High- $k$ Dielectrics

D. C. Gilmer, J. Schaeffer, William J. Taylor et al. · IEEE Transactions on Electron Devices · 2010 · 24 citations

Materials Science, Semiconductors, Electrical Engineering +15

Metrology Challenges for 45-nm Strained-Si Device Technology

Victor Vartanian, Stefan Zollner, Aaron Thean et al. · IEEE Transactions on Semiconductor Manufacturing · 2006 · 17 citations

Materials Engineering, Metrology Challenges, Electrical Engineering +13

Novel Collector Structure Enabling Low-Cost Millimeter-Wave SiGe:C BiCMOS Technology

Jay P. John, J. Kirchgessner, Dave Morgan et al. · Digest of papers - IEEE Radio Frequency Integrated Circuits Symposium · 2007 · 13 citations

Electrical Engineering, Millimeter Wave Technology, C Hbt +13