James N. Hilfiker

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald et al. · Thin Solid Films · 2008 · 305 citations

Materials Science, Optical Materials, Engineering +10

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

John A. Woollam, Blaine Johs, Craig M. Herzinger et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 215 citations

Optical Materials, Engineering, Typical Applications +18

Natural optical activity as the origin of the large chiroptical properties in π-conjugated polymer thin films

Jessica Wade, James N. Hilfiker, Jochen R. Brandt et al. · Nature Communications · 2020 · 130 citations · Full text

Deposition factors and band gap of zinc-blende AlN

Margarita P. Thompson, Gregory W. Auner, Tsvetanka Zheleva et al. · Journal of Applied Physics · 2001 · 120 citations

Aluminium Nitride, Optical Materials, Engineering +16

Optical properties of bulk and thin-film SrTiO3 on Si and Pt

Stefan Zollner, Alexander A. Demkov, R. Liu et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 118 citations · Full text

Optical Materials, Engineering, Thin-film Srtio3 +17