John A. Woollam

Use of Raman scattering to investigate disorder and crystallite formation in as-deposited and annealed carbon films

R. O. Dillon, John A. Woollam, V. Katkanant · Physical review. B, Condensed matter · 1984 · 1.1K citations

Natural Sciences, Materials Engineering, Materials Science +14

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, Blaine Johs, William A. McGahan et al. · Journal of Applied Physics · 1998 · 1.1K citations

Natural Sciences, Materials Engineering, Materials Science +17

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

John A. Woollam, Blaine Johs, Craig M. Herzinger et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 218 citations

Natural Sciences, Materials Engineering, Materials Science +8

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

M. Schubert, John A. Woollam, Blaine Johs et al. · Journal of the Optical Society of America A · 1996 · 178 citations

Natural Sciences, Materials Engineering, Materials Science +15

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

Thomas E. Tiwald, John A. Woollam, Stefan Zollner et al. · Physical review. B, Condensed matter · 1999 · 163 citations

Natural Sciences, Materials Science, Physics +17