Concepedia

Thomas E. Tiwald

TE

23

Publications

1.5K

Citations

18

H-Index

1997

Active since

Affiliations

University of Nebraska–Lincoln(Current)

J.A. Woollam Company (United States)

Motorola (United States)

University of Illinois Urbana-Champaign

Thomas E. Tiwald is an author at University of Nebraska–Lincoln specializing in engineering, optical properties, and applied physics.

Top concepts

EngineeringApplied PhysicsOptical PropertiesOptical MaterialsSpectroscopyMaterial ScienceNatural SciencesPhysicsInstrumentationOptical Characterization

Publications per year

1997–2021

23

Publications

23

Giant optical anisotropy in a quasi-one-dimensional crystal

Shanyuan Niu, Graham Joe, Huan Zhao et al. · Nature Photonics · 2018 · 453 citations

Optical Materials, Engineering, Physics +7

Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry

Thomas E. Tiwald, John A. Woollam, Stefan Zollner et al. · Physical review. B, Condensed matter · 1999 · 163 citations

Optical Materials, Engineering, Spectroscopic Property +22

Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles

Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam et al. · Thin Solid Films · 1998 · 128 citations

Engineering, Physics, Optical Properties +9

Optical properties of bulk c-ZrO2, c-MgO and a-As2S3 determined by variable angle spectroscopic ellipsometry

R. A. Synowicki, Thomas E. Tiwald · Thin Solid Films · 2004 · 92 citations

Materials Science, Optical Materials, Engineering +7

Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry

M. Schubert, Thomas E. Tiwald, John A. Woollam · Applied Optics · 1999 · 77 citations

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