Thomas E. Tiwald - Concepedia

Concepedia

Author

Thomas E. Tiwald

University of Nebraska–Lincoln

Also Known As

Thomas E. Tiwald, Thomas Tiwald, Tiwald, Thomas, Tom Tiwald

46

Publications

1.5K

Citations

19

H-Index

48

Concepts

All Affiliations

University of Nebraska–Lincoln J.A. Woollam Company (United States)Motorola (United States)University of Illinois Urbana-Champaign

TE

About

Thomas E. Tiwald is an author at University of Nebraska–Lincoln specializing in engineering, optical properties, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	18	21	1.4K
2	Applied Physics	17	18	1.3K
3	Natural Sciences	10	10	561
4	Chemistry	5	5	130
5	Electrical Engineering	1	1	36

Thomas E. Tiwald

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23

Publications

1.5K

Citations

18

H-Index

	Year	Citations
Giant optical anisotropy in a quasi-one-dimensional crystal Shanyuan Niu, Graham Joe, Huan Zhao, Nature Photonics Optical MaterialsEngineeringPhysicsOptical PropertiesGiant Optical Anisotropy	2018	453
Carrier concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry Thomas E. Tiwald, John A. Woollam, Stefan Zollner, Physical review. B, Condensed matter Optical MaterialsEngineeringSpectroscopic PropertySemiconductorsElectron Spectroscopy	1999	163
Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Thin Solid Films EngineeringPhysicsOptical PropertiesSpectroscopyNatural Sciences	1998	128
Optical properties of bulk c-ZrO2, c-MgO and a-As2S3 determined by variable angle spectroscopic ellipsometry R. A. Synowicki, Thomas E. Tiwald Thin Solid Films Materials ScienceOptical MaterialsEngineeringMaterial AnalysisOptical Properties	2004	92
Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry M. Schubert, Thomas E. Tiwald, John A. Woollam Applied Optics	1999	77
Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared James N. Hilfiker, Corey Bungay, R. A. Synowicki, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Optical MaterialsEngineeringOptical CharacterizationSpectroscopic PropertyOptical Properties	2003	69
Measurement of rutile TiO 2 dielectric tensor from 0.148 to 33 μm using generalized ellipsometry Thomas E. Tiwald, M. Schubert Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Optical MaterialsEngineeringOptical TestingSpectroscopic PropertyRutile Tio 2	2000	55
Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry Daniel W. Thompson, Michael J. DeVries, Thomas E. Tiwald, Thin Solid Films Materials ScienceOptical MaterialsEngineeringUv-vis SpectroscopyOptical Properties	1998	50
Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam, Thin Solid Films Optical MaterialsEngineeringInfrared SensorOptical DiagnosticsSpectroscopy	1998	43
<title>Recent developments in spectroscopic ellipsometry for in-situ applications</title> Blaine Johs, Jeff Hale, N. J. Ianno, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Optical MaterialsEngineeringOptical TestingWindow BirefringenceOptical Characterization	2001	41

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