Daniel W. Thompson

Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles

Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam et al. · Thin Solid Films · 1998 · 128 citations

Engineering, Physics, Optical Properties +9

Determination of the optical dispersion in ferroelectric vinylidene fluoride (70%)/trifluoroethylene (30%) copolymer Langmuir–Blodgett films

Mengjun Bai, A. V. Sorokin, Daniel W. Thompson et al. · Journal of Applied Physics · 2004 · 69 citations

Optical Materials, Engineering, Thin Film Process Technology +17

Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry

Daniel W. Thompson, Michael J. DeVries, Thomas E. Tiwald et al. · Thin Solid Films · 1998 · 50 citations

Materials Science, Optical Materials, Engineering +10

Determination of the mid-IR optical constants of water and lubricants using IR ellipsometry combined with an ATR cell

Thomas E. Tiwald, Daniel W. Thompson, John A. Woollam et al. · Thin Solid Films · 1998 · 43 citations

Optical Materials, Engineering, Infrared Sensor +13

Optical characterization of porous alumina from vacuum ultraviolet to midinfrared

Daniel W. Thompson, Paul G. Snyder, Leon Castro et al. · Journal of Applied Physics · 2005 · 43 citations

Materials Science, Ultraviolet Light, Porous Alumina +15