Michael J. DeVries - Concepedia

Author

Michael J. DeVries

Also Known As

M. DeVries, M. J. DeVries, M. J. Devries, M.J. DeVries, Michael DeVries, Michael J. DeVries, Michael J. Devries, Michele J. DeVries

Publications

726

Citations

H-Index

Concepts

All Affiliations

University of Nebraska–Lincoln Leibniz Institute of Surface Engineering Northwestern University

About

Michael J. DeVries is an author at University of Nebraska–Lincoln specializing in engineering, materials science, and optical materials.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	510
2	Applied Physics	7	7	335
3	Chemistry	6	6	312
4	Natural Sciences	3	3	141
5	Electrical Engineering	1	1	80

Michael J. DeVries

Publications

704

Citations

H-Index

Page 1

	Year	Citations
Atomic Layer Deposition of Fe<sub>2</sub>O<sub>3</sub> Using Ferrocene and Ozone Alex B. F. Martinson, Michael J. DeVries, Joseph A. Libera, The Journal of Physical Chemistry C Materials ScienceSelf-limiting GrowthOptical MaterialsRobust Thin FilmsEngineering	2011	133
Dye-Sensitized Solar Cells: Driving-Force Effects on Electron Recombination Dynamics with Cobalt-Based Shuttles Michael J. DeVries, Michael J. Pellin, Joseph T. Hupp Langmuir	2010	115
Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry E. Franke, Chris Trimble, Michael J. DeVries, Journal of Applied Physics Atomic Force MicroscopyThin Film PhysicsOptical MaterialsEngineeringLuminescent Glass	2000	90
Visible and infrared optical constants of electrochromic materials for emissivity modulation applications Jeffrey S. Hale, Michael J. DeVries, Brad J. Dworak, Thin Solid Films PhotonicsElectrical EngineeringOptical MaterialsEmissivity Modulation ApplicationsElectrochromic Materials	1998	80
Detailed Spectroscopic, Thermodynamic, and Kinetic Characterization of Nickel(II) Complexes with 2,2‘-Bipyridine and 1,10-Phenanthroline Attained via Equilibrium-Restricted Factor Analysis Douglas A. Vander Griend, D. Kwabena Bediako, Michael J. DeVries, Inorganic Chemistry	2007	79
Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry Daniel W. Thompson, Michael J. DeVries, Thomas E. Tiwald, Thin Solid Films Materials ScienceOptical MaterialsEngineeringUv-vis SpectroscopyOptical Properties	1998	50
Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV E. Franke, M. Schubert, Chris Trimble, Thin Solid Films Materials ScienceOptical MaterialsEngineeringOptical PropertiesOxide Electronics	2001	34
Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide Chris Trimble, Michael J. DeVries, Jeffrey S. Hale, Thin Solid Films Materials SciencePhotoluminescenceEngineeringElectrochromic Crystalline TungstenPolymer Conductor	1999	34
Optical constants of crystalline WO3 deposited by magnetron sputtering Michael J. DeVries, Chris Trimble, Thomas E. Tiwald, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Optical MaterialsEngineeringLuminescent GlassOptoelectronic DevicesChemistry	1999	27
IR ellipsometry studies of polymers and oxygen plasma-treated polymers Corey Bungay, Thomas E. Tiwald, Daniel W. Thompson, Thin Solid Films Materials ScienceIr Ellipsometry StudiesEngineeringPolymer TechnologyPolymer Stability	1998	24

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