Paul G. Snyder - Concepedia

Author

Paul G. Snyder

Also Known As

P. G. Snyder, P. Snyder, P.G Snyder, P.G. Snyder, PAUL G. SNYDER, Paul G Snyder, Paul G. Snyder, Paul Snyder, Snyder, Paul Gene (author)

129

Publications

1.8K

Citations

H-Index

Concepts

All Affiliations

University of Nebraska–Lincoln J.A. Woollam Company (United States)Universal Technical Institute Glenn Research Center Intel (United States)

About

Paul G. Snyder is an author at University of Nebraska–Lincoln specializing in engineering, applied physics, and optical properties.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	37	1.5K
2	Applied Physics	19	35	1.4K
3	Natural Sciences	10	10	497
4	Electrical Engineering	10	10	249
5	Chemistry	3	3	65

Paul G. Snyder

Publications

1.6K

Citations

H-Index

Page 1

	Year	Citations
Optical constants of Ga<i>x</i>In1−<i>x</i>P lattice matched to GaAs M. Schubert, V. Gottschalch, Craig M. Herzinger, Journal of Applied Physics Optical MaterialsEngineeringNative OxideOptoelectronic DevicesOptical Characterization	1995	128
Variable angle of incidence spectroscopic ellipsometry: Application to GaAs-Al<i>x</i>Ga1−<i>x</i>As multiple heterostructures Paul G. Snyder, M. Rost, George H. Bu-Abbud, Journal of Applied Physics Wide-bandgap SemiconductorOptical MaterialsEngineeringElectron-beam LithographyMaximum Sensitivity	1986	123
InP optical constants between 0.75 and 5.0 eV determined by variable-angle spectroscopic ellipsometry Craig M. Herzinger, Paul G. Snyder, Blaine Johs, Journal of Applied Physics Optical MaterialsEngineeringOptic DesignOptical TestingOptical Metrology	1995	122
Modeling Al<i>x</i>Ga1−<i>x</i>As optical constants as functions of composition Paul G. Snyder, John A. Woollam, Samuel A. Alterovitz, Journal of Applied Physics Aluminium NitrideDielectric Function εXOptical MaterialsEngineeringPhysics	1990	104
Temperature dependence of optical properties of GaAs Huade Yao, Paul G. Snyder, John A. Woollam Journal of Applied Physics SemiconductorsHarmonic-oscillator ApproximationElectrical EngineeringOptical MaterialsElectronic Devices	1991	99
Determination of AlAs optical constants by variable angle spectroscopic ellipsometry and a multisample analysis Craig M. Herzinger, H.H. Yao, Paul G. Snyder, Journal of Applied Physics Wide-bandgap SemiconductorOptical MaterialsEngineeringOptical TestingGaas Caps	1995	88
Characterization of pulsed laser deposited zinc oxide N. J. Ianno, L. McConville, Nek Muhammad Shaikh, Thin Solid Films Materials ScienceEngineeringApplied PhysicsLaser Processing TechnologyLaser-assisted Deposition	1992	88
Fundamentals and applications of variable angle spectroscopic ellipsometry John A. Woollam, Paul G. Snyder Materials Science and Engineering B PhysicsOptical PropertiesSpectroscopyNatural SciencesInstrumentation	1990	87
Dielectric functions and electronic band structure of lead zirconate titanate thin films Hosun Lee, Youn Seon Kang, Sang-Jun Cho, Journal of Applied Physics Optical MaterialsEngineeringHalide PerovskitesThin Film Process TechnologyDielectric Functions	2005	70
Preparation and characterization of oxidized silver thin films Leif A. A. Pettersson, Paul G. Snyder Thin Solid Films Materials ScienceEngineeringSurface ScienceSilver Thin FilmsMetallic Nanomaterials	1995	70

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