George H. Bu-Abbud

Variable angle of incidence spectroscopic ellipsometry: Application to GaAs-Al<i>x</i>Ga1−<i>x</i>As multiple heterostructures

Paul G. Snyder, M. Rost, George H. Bu-Abbud et al. · Journal of Applied Physics · 1986 · 123 citations

Wide-bandgap Semiconductor, Optical Materials, Engineering +17

Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis

David C. Ingram, John A. Woollam, George H. Bu-Abbud · Thin Solid Films · 1986 · 26 citations

Diamond-like Carbon, Proton Recoil, Engineering +6

Single-Carrier 400G Unrepeatered WDM Transmission over 443.1 km

João Januário, A. Festa, E.A. Golovchenko et al. · 2017 · 25 citations

Photonics, Multi-carrier Communication, Engineering +11

Roughness studies of ion beam processed molybdenum surfaces

George H. Bu-Abbud, D. Mathine, Paul G. Snyder et al. · Journal of Applied Physics · 1986 · 19 citations

Optical Materials, Engineering, Optical Testing +16

An enhanced sensitivity null ellipsometry technique for studying films on substrates: Application to silicon nitride on gallium arsenide

Samuel A. Alterovitz, George H. Bu-Abbud, John A. Woollam et al. · Journal of Applied Physics · 1983 · 18 citations

Optical Materials, Engineering, Optical Testing +17