George H. Bu-Abbud - Concepedia

Author

George H. Bu-Abbud

University of Nebraska–Lincoln

Also Known As

George Bu-Abbud, George BuAbbud, George H. Bu-Abbud, George H. BuAbbud

Publications

305

Citations

H-Index

Concepts

All Affiliations

University of Nebraska–Lincoln Universal Technical Institute Glenn Research Center Oak Ridge National Laboratory

About

George H. Bu-Abbud is an author at University of Nebraska–Lincoln specializing in engineering, applied physics, and optical properties.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	10	10	272
2	Applied Physics	9	9	247
3	Natural Sciences	2	2	135
4	Chemistry	1	1	26
5	Electrical Engineering	1	1	18

George H. Bu-Abbud

Publications

272

Citations

H-Index

Page 1

	Year	Citations
Variable angle of incidence spectroscopic ellipsometry: Application to GaAs-Al<i>x</i>Ga1−<i>x</i>As multiple heterostructures Paul G. Snyder, M. Rost, George H. Bu-Abbud, Journal of Applied Physics Wide-bandgap SemiconductorOptical MaterialsEngineeringElectron-beam LithographyMaximum Sensitivity	1986	123
Mass density and hydrogen concentration in “diamond-like” carbon films: Proton recoil, Rutherford backscattering and ellipsometric analysis David C. Ingram, John A. Woollam, George H. Bu-Abbud Thin Solid Films Diamond-like CarbonProton RecoilEngineeringCarbon-based MaterialApplied Physics	1986	26
Single-Carrier 400G Unrepeatered WDM Transmission over 443.1 km João Januário, A. Festa, E.A. Golovchenko, PhotonicsMulti-carrier CommunicationEngineeringOptical Transmission SystemUnrepeatered Wdm Transmission	2017	25
Roughness studies of ion beam processed molybdenum surfaces George H. Bu-Abbud, D. Mathine, Paul G. Snyder, Journal of Applied Physics Optical MaterialsEngineeringOptical TestingPolished Molybdenum SamplesOptical Characterization	1986	19
An enhanced sensitivity null ellipsometry technique for studying films on substrates: Application to silicon nitride on gallium arsenide Samuel A. Alterovitz, George H. Bu-Abbud, John A. Woollam, Journal of Applied Physics Optical MaterialsEngineeringOptical TestingThin Film Process TechnologyNanoelectronics	1983	18
Optical and interfacial electronic properties of diamond-like carbon films John A. Woollam, V. Natarajan, Joel D. Lamb, Thin Solid Films Materials ScienceDiamond-like CarbonInterfacial Electronic PropertiesOptical MaterialsEngineering	1984	16
Summary Abstract: Optical, Raman, and photoemission results on amorphous ‘‘diamondlike’’ carbon films D. Mathine, Rodney O. Dillon, A. Azim Khan, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Optical MaterialsEngineeringSolid-state ChemistryVacuum DeviceCarbon-based Material	1984	13
Study of Mo-, Au-, and Ni-implanted molybdenum laser mirrors by multiple angle of incidence spectroscopic ellipsometry Paul G. Snyder, M. Rost, George H. Bu-Abbud, Journal of Applied Physics Multiple AngleOptical MaterialsEngineeringLaser ApplicationsLaser Material	1986	12
Summary Abstract: Multiple-wavelength-angle-of-incidence ellipsometry: Application to silicon nitride–gallium arsenide structures George H. Bu-Abbud, Samuel A. Alterovitz, N. M. Bashara, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceOptical MaterialsEngineeringOptical PropertiesApplied Physics	1983	10
Analytic solutions for optimized ellipsometric measurements of interfaces and surface layers in thin film structures Samuel A. Alterovitz, George H. Bu-Abbud, John A. Woollam Thin Solid Films Materials ScienceSurface CharacterizationEngineeringOptical PropertiesSurface Analysis	1985	10

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