Blaine Johs

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, Blaine Johs, William A. McGahan et al. · Journal of Applied Physics · 1998 · 1.1K citations

Optical Materials, Engineering, Optical Glass +23

Dielectric function representation by B‐splines

Blaine Johs, Jeffrey S. Hale · physica status solidi (a) · 2008 · 263 citations

Optical Materials, Engineering, Optical Testing +16

Development of a parametric optical constant model for Hg1−xCdxTe for control of composition by spectroscopic ellipsometry during MBE growth

Blaine Johs, Craig M. Herzinger, J. H. Dinan et al. · Thin Solid Films · 1998 · 256 citations

Ii-vi Semiconductor, Optical Materials, Engineering +11

Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

John A. Woollam, Blaine Johs, Craig M. Herzinger et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 215 citations

Optical Materials, Engineering, Typical Applications +18

Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

M. Schubert, John A. Woollam, Blaine Johs et al. · Journal of the Optical Society of America A · 1996 · 177 citations

Optical Materials, Engineering, Absorption Spectroscopy +24